Michael Mayer
Associate Professor

 



 

Mailing Address

Michael Mayer

Dept. of Mechanical and Mechatronics Engineering

University of Waterloo

200 University Ave. W.

Waterloo, ON, Canada N2L 3G1

 

Tel. +1-519-8884567 x84024

 

Students

If you are interested in a MASc or PhD project, or if you are interested in an undergraduate research project, please send your resume by email to mmayer@uwaterloo.ca

 

Links

Departmental Webpage

 

Welding and Joining Specialization

List of publications

 

Spinning Copper into Gold gives Company the Edge
(The Globe and Mail 2011)

 

Short Bio

 

Michael Mayer is an Associate Professor at the University of Waterloo in Ontario, Canada. From 2000 to 2004 he was a senior R&D engineer with ESEC in Switzerland. He received a diploma degree in Physics in 1994 and a PhD degree in Technical Sciences in 2000, both from ETH Zurich, Switzerland.

Michael’s research is focused on reliable packaging processes. For this, he has developed microsensor tools and applications since 1996. Michael has co-authored 95 technical publications, including 40 journal papers. 

 

Curriculum

 

 

 

since July 2011

 

Associate Professor
Centre for Advanced Materials Joining (CAMJ)
Department of Mechanical and Mechatronics Engineering (MME)
University of Waterloo (UW), Canada

 

 

2010

 

Guest Editor of Special Issue on Copper Wire Bonding, Microelectronics Reliability

 

2004 - 2011

 

Assistant Professor, CAMJ, MME, UW

2000 - 2004

Process Engineer, Senior Project Leader, and Intellectual Property Coordinator, Esec, Cham, Switzerland

2000

Doctor of Technical Sciences, Department of Electrical Engineering, Swiss Federal Institute of Technology (ETH) Zurich, Zurich, Switzerland

1995 - 2000

Research Assistant and PhD candidate, Physical Electronics Laboratory (PEL), ETH Zurich

1994

Diploma in Physics, ETH Zurich

1992 - 1993

Exchange student, École Polytechnique Fédérale, Lausanne, Switzerland

1989 - 1994

Student of Physics, ETH Zurich

 

Research Areas (Dec. 2011)

Wire Bonding

Microelectronic fine-wire bonding processes are used for almost all microchips and other microsystems. We try to better understand the physical mechanisms responsible for successful thermosonic ball and wedge bonding processes. Our work covers experimental, analytical, and numerical investigations. We use an unique microsensor real-time technology for our experimental work. The analysis of microsensor signals helps to understand mechanical and tribological aspects of the thermosonic bonding process. We are working on a comprehensive ultrasonic wire bonding theory.

Many of our results have been obtained in collaboration with one or more of our partners: MK Electron Co. Ltd., Microbonds Inc., Kulicke and Soffa Industries (K&S), Intel, University of Seoul, Harbin Institute of Technology, Berlin Center of Advanced Packaging (BeCAP) at the Technical University Berlin.

Cu and Pd coated Cu are to replace the commonly used but expensive Au microwires in more and more mass production applications. However, Cu wire can produce higher stresses during bonding increasing the risk of chip damage under the bonding sites (underpad damage), reducing production yield and equipment uptime to a degree that can offset the material cost savings. It is our goal to work towards reducing the risk of underpad damage, increasing Cu ball deformability, and finding low-stress bonding processes.

 

Insulated Bonding Wire

Insulated bonding wire from Microbonds Inc. is a unique technology leading to more miniaturized microelectronics by enabling unpreceded versatility for interconnect and flexibility in design. Bond wire loops can be placed next to each other and even touch each other without electrical shorts. We demonstrate ways how to implement insulated wires in bonding processes.

 

Microsensors, Miniovens

We design Microsensors to study bonding processes and also the quality of bonds during accelerated aging. For the sensors, we use CMOS technology. We also design miniaturized ovens to characterize wire bonds. These miniovens provide for electrical connection to the devices under test while in the oven and at high temperature.

 

 

Page updated on Mar. 27, 2012